The TDS8000 digital sampling oscilloscope offers the widest range of on-board measurement and waveform-processing capabilities of any ultra-high bandwidth oscilloscope. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the TDS8000 is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables and high-speed digital communications. The 8000 Series state-of-the-art timebase provides equivalent time sweep speeds from 0.5 ps/div to 5 ms/div with record lengths from 20 to 4000 points and a sample interval of 10 femtoseconds (0.01 ps). In addition, 8000 Series sampling oscilloscopes' timebases can be locked to a 10 MHz reference providing greater long-term stability. This capability also allows multiple TDS8000s to be synchronized to other test equipment and/or the device-under-test. The TDS8000 offers two magnification windows, whereby sections of the main trace are re-acquired at higher resolution for closer examination of details. The TDS8000 boasts the highest sample rate among sampling oscilloscopes. Its multi-processor architecture, with dedicated per channel Digital Signal Processors (DSP), guarantees the highest waveform acquisition rates regardless of the number of channels acquired or waveform processing done. Features DC to 50 GHz Bandwidth Exceptional Trigger Jitter and Horizontal Timebase Stability Modular Architecture Up to Eight Channels Acquisition High Resolution and Measurement Repeatability Comprehensive, Accurate, Automatic Measurement System Intuitive User Interface Large Display (10.4 in.) Microsoft Windows-based Graphical User Interface