Key facts Comprehensive system approach: High test speed (by „intelligent“ modules) Standardized and powerful software modules (GTSL, EGTSL) with simulation and tracing possibilities The R&S®CompactTSVP family of products is an open test platform based on CompactPCI and PXI and has been developed for high-performance ATE applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions.