The Agilent HP 4155B Semiconductor Parameter Analyzer offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The HP 4155B is best suited for basic semiconductor applications with its non-kelvin connections, 10 V resolution, and 100 mA/100 Ohm measurement range. Other features and specifications of the Agilent Semiconductor Parameter Analyzer include: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with dc or pulse mode Expandable up to 6 SMUs Synchronized stress/measure function Two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer Automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capabilities