The TDS6604 oscilloscope is a high performance solution for verification, debug and characterization of sophisticated electronic designs. It features exceptional signal acquisition performance, operational ease and open connectivity to the design environment. Classic analog-style controls, a large touch-sensitive display and graphical menus provide intuitive control. Open access to the Windows operating system enables unprecedented customization and extensibility. With 6 GHz bandwidth and 20 GS/s sample rate on 2 channels or 10 GS/s sample rate on 4 channels simultaneously, the TDS6604 provides unmatched signal integrity measurements. High performance jitter analysis down to 1.5 psRMS is achieved through exceptional trigger and acquisition performance and applied software.